Weilie Zhou's Advanced scanning microscopy for nanotechnology techniques PDF

By Weilie Zhou

ISBN-10: 0387333258

ISBN-13: 9780387333250

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Precious metals are not suitable for 36 Weilie Zhou et al. high-resolution SEM because of large grain size and high mobility. ” Some structures would be overcoated whereas other regions of the sample surface may have no film coverage whatsoever thereby creating discontinuous films. In addition to decorative effects of large grain (2–6 nm) metal films, the grain size of large grain precious metals increase the scattering effect of the primary electrons resulting in a higher yield of SE2 and SE3.

11 (1978) 303. 18. T. F. Anderson, NY Acad. , 13 (1951) 130–134. 19. R. P. , 8(2) (1994) 289. 20. -R. Peters, Scan. , 4 (1985) 1519. 21. R. P. Apkarian, 45th Annual Proceedings of the Microscopy Society of America (1987) 564. 22. D. C. Joy, 52nd Annual Proceedings of the Microscopy Society of America (1994). 23. E. L. Bearer, L. Orci, P. Sors, J. , 100 (1985) 418. 24. R. P. Apkarian, Scanning, 19 (1997) 361. 2 Electron Backscatter Diffraction (EBSD) Technique and Materials Characterization Examples Tim Maitland and Scott Sitzman 1.

History The discovery of the fundamental diffraction on which EBSD is based can be traced back to 1928, when Shoji Nishikawa and Seishi Kikuchi (Fig. 1) directed a beam of 50 keV electrons from a gas discharge on a cleavage face of calcite at a grazing incidence of 6˚. 4 cm behind and in front of the crystal, respectively, normal to the primary beam. black and white lines in pairs due to multiple scattering and selective reflection” [2] (Figs. 3). Shinohara [3] and Meibohm and Rupp independently saw the same phenomenon shortly after Kikuchi.

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Advanced scanning microscopy for nanotechnology techniques and applications by Weilie Zhou

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