By Elie Maricau
This ebook makes a speciality of modeling, simulation and research of analog circuit getting older. First, all vital nanometer CMOS actual results leading to circuit unreliability are reviewed. Then, transistor getting older compact types for circuit simulation are mentioned and a number of other tools for effective circuit reliability simulation are defined and in comparison. eventually, the effect of transistor getting older on analog circuits is studied. Aging-resilient and aging-immune circuits are pointed out and the effect of know-how scaling is mentioned.
The versions and simulation suggestions defined within the publication are meant as an reduction for machine engineers, circuit designers and the EDA group to appreciate and to mitigate the influence of getting older results on nanometer CMOS ICs.
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Additional info for Analog IC Reliability in Nanometer CMOS
To guarantee reliable circuit operation, electromagnetic compatibility (EMC) regulations for both emission of (EME) and susceptibility to (EMS) interference signals are used. Each circuit, depending on the field of application, must comply to these rules. The international electrotechnical commission (IEC), for example, is one of the international standards organizations which are addressing the need for standardized IC EMC test methods, such as the IEC 61000 standard (IEC 61000 structure 2012).
2003) studied the combined effect of LER and RDF on current fluctuations. They demonstrated that these two sources of transistor variability are statistically independent. Experiments have shown that LER is on the order of 5 nm and does not scale with technology. Also, LER has a much stronger channel length dependence compared to RDF. LER is expected to replace 22 2 CMOS Reliability Overview Fig. 5 Line edge roughness and line width roughness are a major source of process variations and result in an increase of the subthreshold current and variations on the VTH .
The source signal can be deterministic (man-made) or random (natural). g. produced by lightning during thunderstorms) and cosmic noise. Manmade interference signals can be functional signals, which are generated during the normal operation of the source circuits, or accidental signals. Examples of manmade interference are on-chip crosstalk and simultaneous switching noise (functional EMI caused by other circuits that are part of the system) and mobile devices, engine ignitions and microwave ovens (accidental EMI caused by unrelated external sources) (Redoute 2009; Loeckx 2010).
Analog IC Reliability in Nanometer CMOS by Elie Maricau